Relationship between Low-Noise Performance and Electron Confinement in the Channel of Two-Mode Channel Field-Effect Transistors in a Low-Drain-Current Condition
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Published:1995-03-15
Issue:Part 1, No. 3
Volume:34
Page:1483-1487
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Sawada Minoru,Matsumura Kohji,Inoue Daijiro,Nakamoto Hiroyuki,Harada Yasoo
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering