Erratum: “Mitigation of Complementary Metal–Oxide–Semiconductor Variability with Metal Gate Metal–Oxide–Semiconductor Field-Effect Transistors”
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Published:2011-10-31
Issue:
Volume:50
Page:119201
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Yang Ji-Woon,Park Chang Seo,Smith Casey E.,Adhikari Hemant,Huang Jeff,Heh Dawei,Majhi Prashant,Jammy Raj
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering