Nb/Nb Oxide-Based Planar-Type Metal/Insulator/Metal (MIM) Diodes Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process-Reference-Cited by-同舟云学术

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Nb/Nb Oxide-Based Planar-Type Metal/Insulator/Metal (MIM) Diodes Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process

Published:1997-08-15 Issue:Part 2, No. 8B Volume:36 Page:L1120-L1122
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Shirakashi Jun-ichi,Matsumoto Kazuhiko,Miura Naruhisa,Konagai Makoto

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tunneling Magnetoresistance and Spin-Dependent Diode Performance in Fully Epitaxial Magnetic Tunnel Junctions With a Rocksalt ZnO/MgO Bilayer Tunnel Barrier;Physical Review Applied;2019-06-13

2. Radio-Frequency Rectifier for Electromagnetic Energy Harvesting: Development Path and Future Outlook;Proceedings of the IEEE;2014-11

3. Cross-sectional transmission electron microscopy analysis of a single self-assembled quantum dot single electron transistor fabricated by atomic force microscope local oxidation;Japanese Journal of Applied Physics;2014-03-31

4. Electromechanical tuning of nanoscale MIM diodes by nanoindentation;Journal of Materials Research;2013-06-27

5. The principles and applications of nano-diagnosis system for a nano-biosensor;Korean Journal of Chemical Engineering;2011-03-30

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