Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy-Reference-Cited by-同舟云学术

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Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy

Published:2005-04-08 Issue:4A Volume:44 Page:1633-1636
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Miyato Yuji,Kobayashi Kei,Matsushige Kazumi,Yamada Hirofumi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 35 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurements of the work function of AgI intercalated carbon nanotubes using different scanning techniques;Physica E: Low-dimensional Systems and Nanostructures;2022-01

2. Charge transport in semiconducting carbon nanotube networks;Applied Physics Reviews;2021-12

3. Application of Kelvin Probe Force Microscopy to Microstructure Evaluation of Steel;Tetsu-to-Hagane;2020

4. Surface-screening mechanisms in ferroelectric thin films and their effect on polarization dynamics and domain structures;Reports on Progress in Physics;2018-01-25

5. Measurements of the work function of single-walled carbon nanotubes encapsulated by AgI, AgCl, and CuBr using kelvin probe technique with different kinds of probes;Journal of Experimental and Theoretical Physics;2016-07

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