Characterization of Wurtzite Zn1-xCdxO Films Using Remote Plasma-Enhanced Metalorganic Chemical Vapor Deposition-Reference-Cited by-同舟云学术

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Characterization of Wurtzite Zn1-xCdxO Films Using Remote Plasma-Enhanced Metalorganic Chemical Vapor Deposition

Published:2004-10-15 Issue:No. 11A Volume:43 Page:L1452-L1454
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Nakamura Atsushi,Ishihara Junji,Shigemori Satoshi,Yamamoto Kenji,Aoki Toru,Gotoh Hideki,Temmyo Jiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/43/i=11A/a=L1452/pdf

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2. Effect of Substrate Temperature and Molarity on Optical and Electrical Properties of Mixed Structured Zn0.80Cd0.20O Thin Films;Journal of Electronic Materials;2018-08-13

3. ZnCdO: Status after 20 years of research;Materials Science in Semiconductor Processing;2017-10

4. Effect of sapphire substrate orientations on the microstructural, optical and NO2 gas sensing properties of Zn(1−x)CdxO thin films synthesized by sol gel spin-coating method;Superlattices and Microstructures;2016-06

5. Structural, morphological and optical properties of Cd doped ZnO film grown on a- and r-plane sapphire substrate by MOCVD;Applied Surface Science;2014-08

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