Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip-Reference-Cited by-同舟云学术

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Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

Published:2000-06-30 Issue:Part 1, No. 6B Volume:39 Page:3707-3710
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Choi Nami,Uchihashi Takayuki,Nishijima Hidehiro,Ishida Takao,Mizutani Wataru,Akita Seiji,Nakayama Yoshikazu,Ishikawa Mitsuru,Tokumoto Hiroshi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of Vibration Frequency of Carbon Nanotubes used as Nano-Force Sensors Considering Clamped Boundary Condition;Electronics;2019-09-24

2. Electron properties of a microcolumn with a CNT tip;Optik;2015-12

3. Study of Biomolecules Imaging Using Molecular Dynamics Simulations;Nano;2015-10

4. Buckling Instability of Carbon Nanotube Atomic Force Microscope Probe Clamped in an Elastic Medium;Journal of Nanotechnology in Engineering and Medicine;2012-05-01

5. Carbon Nanotube Tips in Atomic Force Microscopy with Applications to Imaging in Liquid;Atomic Force Microscopy in Liquid;2012-04-10

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