Dependence of Electrical Characteristics of NbN/TiN/NbN Josephson Junctions on Barrier Thickness and Temperature-Reference-Cited by-同舟云学术

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Dependence of Electrical Characteristics of NbN/TiN/NbN Josephson Junctions on Barrier Thickness and Temperature

Published:2000-12-15 Issue:Part 2, No. 12B Volume:39 Page:L1289-L1291
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Yamamori Hirotake,Sasaki Hitoshi,Shoji Akira

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of Self-Shunted Josephson Junctions for a Ten-Superconductor-Layer Fabrication Process: Nb/NbN_x/Nb Junctions;IEEE Transactions on Applied Superconductivity;2024-05

2. Transport Properties of NbN Thin Films Patterned With a Focused Helium Ion Beam;IEEE Transactions on Applied Superconductivity;2023-08

3. Intrinsically shunted Josephson junctions with high characteristic voltage based on epitaxial NbN/TaN/NbN trilayer;Applied Physics Letters;2021-10-11

4. Effects of manganese and nickel addition on the preparation of niobium oxynitrides;Journal of the European Ceramic Society;2015-10

5. Microwave Characteristics of NbN/NbNx/NbN Josephson Junctions for Quantum Voltage Standards;Japanese Journal of Applied Physics;2005-10-14

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