Theoretical and Experimental Study on Nanoscale Ferroelectric Domain Measurement Using Scanning Nonlinear Dielectric Microscopy
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Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 53 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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3. Surface-screening mechanisms in ferroelectric thin films and their effect on polarization dynamics and domain structures;Reports on Progress in Physics;2018-01-25
4. Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy;Japanese Journal of Applied Physics;2017-09-28
5. Negative correlation between electrical response and domain size in a Ti-composition-gradientPb[(Mg1/3Nb2/3)1−xTix]O3crystal near the morphotropic phase boundary;Physical Review B;2015-11-30
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