500-nm-Resolution 10 keV X-Ray Imaging Transmission Microscope with Tantalum Phase Zone Plates-Reference-Cited by-同舟云学术

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500-nm-Resolution 10 keV X-Ray Imaging Transmission Microscope with Tantalum Phase Zone Plates

Published:2000-05-01 Issue:Part 2, No. 5A Volume:39 Page:L433-L435
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kagoshima Yasushi,Ibuki Takashi,Takai Kengo,Yokoyama Yoshiyuki,Miyamoto Naoki,Tsusaka Yoshiyuki,Matsui Junji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of a Compact Scanning Transmission X-ray Microscope (STXM) at the Photon Factory;Chemistry Letters;2014-03-05

2. Tandem-Phase Zone-Plate Optics for High-Energy X-ray Focusing;Japanese Journal of Applied Physics;2011-02-21

3. Tandem-Phase Zone-Plate Optics for High-Energy X-ray Focusing;Japanese Journal of Applied Physics;2011-02-01

4. Development of micro-tomography system with Fresnel zone plate optics at SPring-8;SPIE Proceedings;2006-08-31

5. X-ray polycapillary imaging microscopy;SPIE Proceedings;2005-07-07

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