Effects of Substrate Heating on the Amorphous Structure of InGaZnO Films and the Electrical Properties of Their Thin Film Transistors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Effects of Substrate Heating on the Amorphous Structure of InGaZnO Films and the Electrical Properties of Their Thin Film Transistors

Published:2010-11-12 Issue:11 Volume:3 Page:111101
ISSN:1882-0778
Container-title:Applied Physics Express
language:en
Short-container-title:Appl. Phys. Express

Author:

Moon Mi Ran,Na Sekwon,Jeon Haseok,An Chee-Hong,Park Kyung,Jung Donggeun,Kim Hyoungsub,Lee Young-Boo,Lee Hoo-Jeong

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/3/i=11/a=111101/pdf

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High‐performance vacuum‐processed metal oxide thin‐film transistors: A review of recent developments;Journal of the Society for Information Display;2020-04-27

2. Evolution of Defect Structures and Deep Subgap States during Annealing of Amorphous In-Ga-Zn Oxide for Thin-Film Transistors;Physical Review Applied;2018-01-17

3. Band offsets in HfTiO/InGaZnO4 heterojunction determined by X-ray photoelectron spectroscopy;Journal of Alloys and Compounds;2015-09

4. Comparison of composition and atomic structure of amorphous indium gallium zinc oxide thin film transistor before and after positive bias temperature stress by transmission electron microscopy;Semiconductor Science and Technology;2015-04-07

5. Effects of high-temperature thermal annealing on the electronic properties of In-Ga-Zn oxide thin films;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP