Analysis of the Atomic Structure of the Si(111)$\sqrt{3}{\times}\sqrt{3}$-Bi Surface by X-Ray Photoelectron Diffraction-Reference-Cited by-同舟云学术

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Analysis of the Atomic Structure of the Si(111)$\sqrt{3}{\times}\sqrt{3}$-Bi Surface by X-Ray Photoelectron Diffraction

Published:1987-08-20 Issue:Part 2, No. 8 Volume:26 Page:L1335-L1337
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Park Chong Yun,Abukawa Tadashi,Higashiyama Kazuyuki,Kono Shozo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Si(111) islands on β-phase Si(111)√3 × √3R30°-Bi;Microstructures;2024-04-10

2. Evidence of sp2-like Hybridization of Silicon Valence Orbitals in Thin and Thick Si Grown on α-Phase Si(111)√3 × √3R30°-Bi;Materials;2022-02-25

3. Adsorbate structure determination using photoelectron diffraction: Methods and applications;Surface Science Reports;2007-01-01

4. Angle-resolved ultraviolet photoelectron spectroscopy study on the α-Si(111)-Bi surface;Surface Science;2002-02

5. Photoelectron holography studies of Bi on Si(111);Surface Science;1998-11

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