Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope-Reference-Cited by-同舟云学术

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Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope

Published:1994-06-30 Issue:Part 1, No. 6B Volume:33 Page:3739-3742
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Sugawara Yasuhiro,Ohta Masahiro,Hontani Kouji,Morita Seizo,Osaka Fukunobu,Ohkouchi Shunsuke,Suzuki Mineharu,Nagaoka Hideki,Mishima Shuzo,Okada Takao

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning impedance microscopy (SIM): A novel approach for AC transport imaging;INT J NANO DIMENS;2016

2. Atomically resolved force microscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2013-09

3. Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope;Journal of Electron Microscopy;2004-04-01

4. Mapping and control of atomic force on Si(111)√3×√3–Ag surface using noncontact atomic force microscope;Ultramicroscopy;2002-05

5. Noncontact Atomic Force Microscopy;Optical and Electronic Process of Nano-Matters;2001

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