Analysis Technique for Wavelength Dispersion of Refractive Indices by Renormalized Transmission Spectroscopic Ellipsometry-Reference-Cited by-同舟云学术

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Analysis Technique for Wavelength Dispersion of Refractive Indices by Renormalized Transmission Spectroscopic Ellipsometry

Published:2012-07-12 Issue: Volume:51 Page:081701
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Goda Kazuya,Kimura Munehiro,Akahane Tadashi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Numerical Simulation on Optical Characteristics of ZnO/Cu/ZnO Thin Film;Journal of Nanoscience and Nanotechnology;2016-01-01

3. Evaluation technique of cell thickness, pretilt angle, and twist angle for guest–host liquid crystal displays;Journal of the Optical Society of America A;2013-03-26

4. Evaluation of azimuthal anchoring energy for liquid crystal device equipped with color filter by means of renormalized transmission ellipsometry;Journal of the Society for Information Display;2012-12

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