Conductance between Two Scanning-Tunneling-Microscopy Probes in Carbon Nanotubes
Author:
Affiliation:
1. National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565
2. Department of Physics, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8551
Publisher
Japan Society of Applied Physics
Subject
General Physics and Astronomy
Link
https://journals.jps.jp/doi/pdf/10.1143/JPSJ.77.024703
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Nanographene and Graphene Edges: Electronic Structure and Nanofabrication;Accounts of Chemical Research;2012-11-21
2. Graphene edges; localized edge state and electron wave interference;EPJ Web of Conferences;2012
3. Role of edges in the electronic and magnetic structures of nanographene;Physica Scripta;2012-01-01
4. Interface Landau levels in graphene monolayer-bilayer junctions;Physical Review B;2010-11-30
5. Honeycomb superperiodic pattern and its fine structure near the armchair edge of graphene observed by low-temperature scanning tunneling microscopy;Physical Review B;2010-06-10
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