Characteristics and Reduction of Noise in Scanning Hot Electron Microscopy
-
Published:1998-12-15
Issue:Part 1, No. 12A
Volume:37
Page:6580-6584
-
ISSN:0021-4922
-
Container-title:Japanese Journal of Applied Physics
-
language:en
-
Short-container-title:Jpn. J. Appl. Phys.
Author:
Kikegawa Nobutaka,Furuya Kazuhito,Vazquez Francisco,Ikeda Yoshihiro
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering