Critical Voltage for Atom Migration in Ballistic Copper Nanojunctions and Its Implications to Interconnect Technology for Very Large Scale Integrated Circuits-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Critical Voltage for Atom Migration in Ballistic Copper Nanojunctions and Its Implications to Interconnect Technology for Very Large Scale Integrated Circuits

Published:2010-11-05 Issue:11 Volume:3 Page:115201
ISSN:1882-0778
Container-title:Applied Physics Express
language:en
Short-container-title:Appl. Phys. Express

Author:

Sakata Shuichi,Umeno Akinori,Yoshida Kenji,Hirakawa Kazuhiko

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/3/i=11/a=115201/pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Theory for electromigration at metal nanocontacts driven by kinetic energy transfer from “lucky electrons”;Applied Physics Express;2024-07-01

2. Electromigration at atomic-scale metal nanojunctions driven by “lucky electrons”;Applied Physics Express;2023-08-01

3. Terahertz Field Enhancement and Photon-Assisted Tunneling in Single-Molecule Transistors;Physical Review Letters;2015-09-23

4. One-Dimensional Nanotemplate Structure of a Si(110) Substrate;e-Journal of Surface Science and Nanotechnology;2012

5. Fabrication and Transport Properties of Quantum Nanotransistors Coupled with Nanogap Electrodes;Journal of the Vacuum Society of Japan;2012

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP