Temperature Dependence of Complex Refractive Index of Sputtered Sb–Te Alloy Thin Films-Reference-Cited by-同舟云学术

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Temperature Dependence of Complex Refractive Index of Sputtered Sb–Te Alloy Thin Films

Published:2007-08-06 Issue:8A Volume:46 Page:5278-5280
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Suzuki Osamu,Kuwahara Masashi,Yamakawa Yuzo,Suzuki Michio,Tsutsumi Kouichi,Fukaya Toshio,Tominaga Junji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference13 articles.

1. Premastered Optical Disk by Superresolution Using Rear Aperture Detection

2. An approach for recording and readout beyond the diffraction limit with an Sb thin film

3. Thermal Origin of Readout Mechanism of Light-Scattering Super-Resolution Near-Field Structure Disk

4. Ferroelectric catastrophe: beyond nanometre-scale optical resolution

5. Thermal Effect of Readout Mechanism on Super Resolution Near-field Structure Disk

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3. Measurement of the optical properties of a transparent, conductive carbon nanotube film using spectroscopic ellipsometry;Japanese Journal of Applied Physics;2015-06-04

4. Track error detection system with waveform comparison method for super-resolution optical read-only-memory disc;IEEE Transactions on Consumer Electronics;2014-08

5. Complex Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Crystalline Sb–Te Alloys and ZnS–SiO2with Various Compositions at High Temperatures;Japanese Journal of Applied Physics;2013-12-01

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