Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode-Reference-Cited by-同舟云学术

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Relationship between Surface Roughness of Indium Tin Oxide and Leakage Current of Organic Light-Emitting Diode

Published:2003-04-15 Issue:Part 2, No. 4B Volume:42 Page:L438-L440
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kim Ki-Beom,Tak Yoon-Heung,Han Yoon-Soo,Baik Kwang-Heum,Yoon Myung-Hee,Lee Moon-Ho

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/42/i=4B/a=L438/pdf

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