Differential Cross Section Measurements for One-Electron Capture Process in Ar2+–Ne System atElab=40, 60 and 80 eV-Reference-Cited by-同舟云学术

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Differential Cross Section Measurements for One-Electron Capture Process in Ar2+–Ne System atElab=40, 60 and 80 eV

Published:1994-03-15 Issue:3 Volume:63 Page:941-947
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Itoh Yoh¹

Affiliation:

1. Physics Laboratory, Faculty of Science, Josai University, Sakado, Saitama 350-02

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.63.941

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The forward glory effect in the differential cross sections measured belowElab= 50 eV for the one-electron capture process in N5+–He collisions;Journal of Physics B: Atomic, Molecular and Optical Physics;2011-08-09

2. Measurements of state-selective differential cross sections for the one-electron capture process in the O2+-He system at Elab = 30, 40 and 50 eV;Journal of Physics B: Atomic, Molecular and Optical Physics;2002-07-09

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