Electron Microscopy of Thin Twins and Stacking Faults-Reference-Cited by-同舟云学术

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Electron Microscopy of Thin Twins and Stacking Faults

Published:1966-09 Issue:9 Volume:5 Page:788-795
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Fujita Hiroshi,Kawasaki Yōzō

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. References;Thin Films by Chemical Vapour Deposition;1990

2. Methode pour caracteriser l'ordre des micromacles en relation avec les sources a partir d'observations in situ;Acta Metallurgica;1988-06

3. A Dynamic Study of Strain-Induced γ→α′ Martensitic Transformation in an Fe-Cr-Ni Alloy;Journal of the Japan Institute of Metals;1988

4. Strain-Induced FCC(γ)→HCP(ε) Phase Transformation and Active Slip Systems;Transactions of the Japan Institute of Metals;1977

5. Recovery in aluminium studied by an in situ technique in a high voltage electron microscope;Journal of Materials Science;1975-02

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