Design Technique for Ramped Gate Soft-Programming in Over-Erased NOR Type Flash EEPROM Cells
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Published:2005-04-22
Issue:No. 19
Volume:44
Page:L578-L580
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Baek Chang-Ki,Kim Bomsoo,Quan Wu-yun,Kwon Wookhyun,Park Young June,Min Hong Shick
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering