Resistivity Correction Factor for the Four-Probe Method: Experiment I-Reference-Cited by-同舟云学术

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Resistivity Correction Factor for the Four-Probe Method: Experiment I

Published:1988-05-20 Issue:Part 1, No. 5 Volume:27 Page:869-870
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Yamashita Masato,Yamaguchi Shoji,Enjoji Hideo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Surface Modification of Stainless Steel with Ti–Si–C Thin Films by Magnetron Sputtering Using Elemental Targets at Low Preparation Temperatures;Japanese Journal of Applied Physics;2013-11-01

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5. Preparation of MAX-Phase-Containing Ti–Si–C Thin Films by Magnetron Sputtering Using Elemental Targets;Japanese Journal of Applied Physics;2012-01-20

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