Characterization of Diamond Films by Means of a Pulsed Positron Beam-Reference-Cited by-同舟云学术

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Characterization of Diamond Films by Means of a Pulsed Positron Beam

Published:1992-07-15 Issue:Part 1, No. 7 Volume:31 Page:2237-2240
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Suzuki Ryoichi,Kobayashi Yoshinori,Mikado Tomohisa,Ohgaki Hideaki,Chiwaki Mitsukuni,Yamazaki Tetsuo,Uedono Akira,Tanigawa Shoichiro,Funamoto Hiroyuki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Defect identification in semiconductors with positron annihilation: Experiment and theory;Reviews of Modern Physics;2013-11-14

3. Open Volume Defects;Semiconductors and Semimetals;2013

4. Identification of nitrogen decorated vacancies in CVD diamond films using positron annihilation coincidence Doppler broadening spectroscopy;Diamond and Related Materials;2004-09

5. Positron annihilation investigation of vacancies in as-grown and electron-irradiated diamonds;Diamond and Related Materials;2000-08

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