Raman Spectroscopic and X-Ray Diffraction Study of Sulfur under High Pressure-Reference-Cited by-同舟云学术

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Raman Spectroscopic and X-Ray Diffraction Study of Sulfur under High Pressure

Published:1992-04-15 Issue:Part 1, No. 4 Volume:31 Page:1078-1084
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Nagata Kiyofumi,Nishio Takashi,Taguchi Hironori,Miyamoto Yasuhiko

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Are photo-induced crystalline sulfur and S-II equivalent under high pressure?;Journal of Photochemistry and Photobiology A: Chemistry;2022-09

2. Crucial role of S₈-rings in structural, relaxation, vibrational, and electronic properties of liquid sulfur close to the λ transition;The Journal of Chemical Physics;2022-08-07

3. Electrochemical investigation of Li-ion diffusion and absorbing polysulfide of hierarchically structured carbon for the quasi-solid lithium-sulfur batteries;Ionics;2021-07-06

4. Reversible Photochemical Transformation of S and H2 Mixture to (H2S)2H2 at High Pressures;The Journal of Physical Chemistry C;2017-05-31

5. Investigation of CoS2-based thin films as model catalysts for the oxygen reduction reaction;Journal of Catalysis;2008-08-15

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