Focusing Effect of MeV Muon Beam with a Tapered Capillary Method-Reference-Cited by-同舟云学术

Focusing Effect of MeV Muon Beam with a Tapered Capillary Method

Published:2011-04-15 Issue:4 Volume:80 Page:044501
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Tomono Dai¹,M. Kojima Takao²,Ishida Katsuhiko¹,Ikeda Tokihiro²,Iwai Yoshio²,Tokuda Makoto¹³,Kanazawa Yuu⁴,Matsuda Yasuyuki⁵,Matsuzaki Teiichiro¹,Iwasaki Masahiko¹³,Yamazaki Yasunori²⁵

Affiliation:

1. Advanced Meson Science Laboratory, RIKEN Nishina Center for Accelerator Based Science, RIKEN, Wako, Saitama 351-0198, Japan

2. Atomic Physics Laboratory, RIKEN Advanced Science Institute, RIKEN, Wako, Saitama 351-0198, Japan

3. Department of Physics, Tokyo Institute of Technology, Meguro, Tokyo 152-8551, Japan

4. Department of Physics, Sophia University, Chiyoda, Tokyo 102-8554, Japan

5. Graduate School of Arts and Sciences, University of Tokyo, Meguro, Tokyo 153-8902, Japan

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.80.044501

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