Author:
Tomokage Hajime,Hagiwara Muneyuki,Hashimoto Kimio
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
4 articles.
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1. Simple ICTS Measurement Method;Japanese Journal of Applied Physics;1982-05-20
2. 2 Diffusion in Si - References;Diffusion in Semiconductors
3. 2 Diffusion in Si;Diffusion in Semiconductors
4. Silicon, ionization energies and structural information on impurities: Be – Ce;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements