An Airlock for a Resistively Heatable Specimen of a Field Ion Microscope and an Atom-Probe-Reference-Cited by-同舟云学术

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An Airlock for a Resistively Heatable Specimen of a Field Ion Microscope and an Atom-Probe

Published:1982-07-20 Issue:Part 2, No. 7 Volume:21 Page:L429-L430
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Nishikawa Osamu,Horie Shiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Field Ion Microscope Observation of Mo Deposition with a Video System;Japanese Journal of Applied Physics;1996-10-01

2. Atom-probe study of silicide formation at Ni/Si interfaces;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1984

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