Analysis of Current Components Observed by Cyclic Current-Voltage Measurement in Metal-Oxide-Semiconductor Capacitors
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Published:2000-11-15
Issue:Part 2, No. 11B
Volume:39
Page:L1152-L1154
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Jeon Hyungoo,Choi Sungwoo,Ahn Byungchul,Roh Yonghan
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering