Quantitative Analysis of Polarization Phenomena in CdTe Radiation Detectors-Reference-Cited by-同舟云学术

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Quantitative Analysis of Polarization Phenomena in CdTe Radiation Detectors

Published:2006-11-08 Issue:11 Volume:45 Page:8842-8847
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Toyama Hiroyuki,Higa Akira,Yamazato Masaaki,Maehama Takehiro,Ohno Ryoichi,Toguchi Minoru

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 79 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 2-mm-thick large-area CdTe double-sided strip detectors for high-resolution spectroscopic imaging of X-ray and gamma-ray with depth-of-interaction sensing;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-02

2. Charge-Sharing Detection Method Using Semiconductor Detectors with Different Electron and Hole Mobilities;Sensors and Materials;2024-01-26

3. Polarization Effects on Diode-type Cadmium Telluride Detector with High Current Density;Sensors and Materials;2024-01-26

4. Cd(Zn)Te Detectors for Hard X-ray and Gamma-ray Astronomy;Handbook of X-ray and Gamma-ray Astrophysics;2024

5. Spectrometry of electron irradiated cdTe Schottky-barrier semiconductor detectors before polarization onset;AIP Conference Proceedings;2023

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