Hard X-ray Photoelectron Emission Microscopy as Tool for Studying Buried Layers-Reference-Cited by-同舟云学术

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Hard X-ray Photoelectron Emission Microscopy as Tool for Studying Buried Layers

Published:2006-03-08 Issue:3A Volume:45 Page:1886-1888
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Wakita Takanori,Taniuchi Toshiyuki,Ono Kanta,Suzuki Motohiro,Kawamura Naomi,Takagaki Masafumi,Miyagawa Hayato,Guo FangZhun,Nakamura Tetsuya,Muro Takayuki,Akinaga Hiroyuki,Yokoya Takayoshi,Oshima Masaharu,Kobayashi Keisuke

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Imaging buried objects with the hard/soft x-ray photoemission electron microscope;Journal of Applied Physics;2021-11-07

2. Momentum Microscopy;Springer Series in Surface Sciences;2021

3. From Photoemission Microscopy to an “All-in-One” Photoemission Experiment;e-Journal of Surface Science and Nanotechnology;2020-02-29

4. Imaging Atomically Thin Semiconductors Beneath Dielectrics via Deep Ultraviolet Photoemission Electron Microscopy;Physical Review Applied;2019-12-31

5. Recent applications of hard x-ray photoelectron spectroscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2016-05

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