1. The distribution of thin films condensed on surfaces by the vacuum evaporation method
2. Behrndt K H 1963 Thickness uniformity on rotating substrates, in Transactions of the 10th AVS National Vacuum Symposium (London: McMillan) 379-384
3. Jancke E and Emde F 1952 Tables of Higher Functions ed 5th (Leipzig: Teubner)
4. Application of the Concept of Effective Refractive Index to the Measurement of Thickness Distributions of Dielectric Films