Using Scanning Tunneling Microscopy to Realize Atomic- Scale Silicon Devices-Reference-Cited by-同舟云学术

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Using Scanning Tunneling Microscopy to Realize Atomic- Scale Silicon Devices

Published:2013-04-17 Issue: Volume: Page:
ISSN:
Container-title:Single-Atom Nanoelectronics
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Author:

Fuechsle Martin,Simmons Michelle

Publisher

Pan Stanford Publishing

Link

http://www.crcnetbase.com/doi/pdf/10.1201/b14792-5

Reference66 articles.

1. Where Do the Dopants Go?

2. Integrated nanoelectronics for the future

3. Shor, P. W. (1994) Algorithms for quantum computation: discrete logarithms and factoring, in35th Annual Symposium on Foundations of Computer Science (ed Goldwasser, S.), IEEE Computer Society Press, pp.124-134.

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1. Reaction paths of phosphine dissociation on silicon (001);The Journal of Chemical Physics;2016-01-07

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