1. Imaging, spectroscopy and spectroscopic imaging with an energy filtered field emission TEM
2. Applications of focused ion beam microscopy to materials science specimens
3. FIB Techniques for Analysis of Metallurgical Specimens
4. J Benedict, R Anderson, SJ Klepeis. In: RM Anderson, ed. Workshop on Specimen Preparation for Transmission Electron Microscopy of Materials III. Proceedings of the Materials Research Society Vol 254. Pittsburgh, PA: Materials Research Society, 1992, p121.
5. T Malis, D Steele. Ultramicrotomy for materials science. In: RM Anderson, ed. Workshop on Specimen Preparation for Transmission Electron Microscopy of Materials II. Proceedings of the Materials Research Society Vol 199. Pittsburgh, PA: Materials Research Society, 1987, p3.