Bottom-Metal Induced Leakage Current of LTPS Diode for ESD Protection
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Published:2018-07-23
Issue:11
Volume:86
Page:189-192
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Trans.
Author:
Hwang Han Wook,
Kim Ki WooORCID,
Ha Yong Min,
Kim Hyun JaeORCID
Publisher
The Electrochemical Society