(Invited) Hydrogen-Related Trap States Induced during Fabrication Process and Annealing Effects in Amorphous in-Ga-Zn-O Thin Film Transistors
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Published:2018-07-23
Issue:11
Volume:86
Page:117-123
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Trans.
Author:
Ochi Mototaka,
Hino Aya,
Goto Hiroshi,
Hayashi KazushiORCID,
Kugimiya Toshihiro
Publisher
The Electrochemical Society