Author:
Sakurai Yoko,Ohmori Kenji,Yamada Keisaku,Shiraishi Kenji,Kakushima Kuniyuki,Iwai Hiroshi,Nomura Shintaro
Abstract
We present results of the photoluminescence (PL) measurements of silicon nanowires (NWs) and silicon nanolayers for device characterization.
Publisher
The Electrochemical Society