Performance Comparison of GaN HEMTs on Diamond and SiC Substrates Based on Surface Potential Model

Author:

Wu Qingzhi,Xu Yuehang,Zhou Jianjun,Kong Yuechan,Chen Tangsheng,Wang Yan,Lin Fujiang,Fu Yu,Jia Yonghao,Zhao Xiaodong,Yan Bo,Xu Ruimin

Funder

National Natural Science Foundation of China (NSFC)

China Postdoctoral Science Foundation

Publisher

The Electrochemical Society

Subject

Electronic, Optical and Magnetic Materials

Reference30 articles.

1. High electron mobility transistor based on a GaN‐AlxGa1−xN heterojunction

2. AlGaN/AlN/GaN/SiC HEMT structure with high mobility GaN thin layer as channel grown by MOCVD

3. Ejeckam F. Francis D. Faili F. “S2-Tl: GaN-on-diamond: A brief history,” Lesecr Eastman Conference on High Performance Devices (LEC), NY Ithaca: IEEE, 2014, 1 (2014).

4. Francis D. Wasserbauer J. Faili F. “GaN HEMT Epilayers on Diamond Substrates: Recent Progress,” 2007 International Conference on Compound Semiconductor Manufacturing Technology, USA Texas Austin: Mantech, 133 (2007).

5. Blevins J. D. Via G. D. Sutherlin K. “Recent progress in GaN-on-diamond device technology,” CS Mantech Conference, Denver, Colorado, USA, May 19–22, 2014.

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