Interference Photovoltage Spectroscopy. Probing of the Silicon‐Sapphire Interface of SOS Films-Reference-Cited by-同舟云学术

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Interference Photovoltage Spectroscopy. Probing of the Silicon‐Sapphire Interface of SOS Films

Published:1985-08-01 Issue:8 Volume:132 Page:1985-1986
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Lagowski J.¹²,Jastrzebski L.¹²,Duffy M. T.¹²,Cullen G. W.¹²

Affiliation:

1. Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

2. RCA Laboratories, Princeton, New Jersey 08540

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2114266/pdf

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