1. Interaction of positron beams with surfaces, thin films, and interfaces
2. Characterization of defects in Si and SiO2−Si using positrons
3. P. Hautojärvi and C. Corbel, inPositron Spectroscopy of Solids, A. Dupasquier and A. P. Mills, Jr., Editors, p. 491, IOS Press, Amsterdam (1995).
4. Detection of Corrosion‐Related Defects in Aluminum Using Positron Annihilation Spectroscopy
5. M. Fomino, K. R. Hebert, P. Asoka-Kumar, and K. G. Lynn, inCritical Factors in Localized Corrosion III, R. G. Kelly, G. S. Frankel, P. M. Natishan, and R. C. Newman, Editors, PV 98-17, p. 642, The Electrochemical Society Proceedings Series, Pennington, NJ (1999).