(Invited) SiOxNy Back-End Integration Technologies for Heterogeneously Integrated Si Platform
-
Published:2016-08-18
Issue:8
Volume:75
Page:211-221
-
ISSN:1938-5862
-
Container-title:ECS Transactions
-
language:
-
Short-container-title:ECS Trans.
Author:
Nishi Hidetaka,Tsuchizawa Tai,Kakitsuka Takaaki,Hasebe Koichi,Takeda Koji,Hiraki Tatsuro,Fujii Takuro,Yamamoto Tsuyoshi,Matsuo Shinji
Abstract
Photonic integrated circuits on Si have been attracting much attention and are being intensively investigated. On a Si photonic chip, in addition to the monolithic Si and Ge photonic devices, InP-based active devices can be integrated heterogeneously by utilizing direct-bonding technology. To connect these functional devices, we have proposed back-end photonic wiring using silicon oxynitride (SiO
x
N
y
) -based waveguides. In this paper, we report recent progress in our back-end photonics integration technology. First, back-end SiO
x
waveguide integration with InP-based membrane active devices will be presented. Then, our technology for the low-loss SiO
x
N
y
deposition at low temperature will be presented, which is applied to a SiN waveguide for compact arrayed-waveguide-grating (AWG) filter and Ge integration. These technologies have attributes for future highly integrated photonic circuits on Si.
Publisher
The Electrochemical Society