Effect of Semiconductor Inhomogeneities on Carrier Mobilities Measured by the van der Pauw Method-Reference-Cited by-同舟云学术

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Effect of Semiconductor Inhomogeneities on Carrier Mobilities Measured by the van der Pauw Method

Published:1974 Issue:9 Volume:121 Page:1212
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:en
Short-container-title:J. Electrochem. Soc.

Author:

Westbrook R. D.

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Grown-In Lattice Defects and Diffusion in Czochralski-Grown Germanium;Defect and Diffusion Forum;2004-11

2. Electrical characterization of liquid-phase epitaxially grown single-crystal films of mercury cadmium telluride by variable-magnetic-field Hall measurements;Semiconductor Science and Technology;1994-09-01

3. Correlation between deep-level parameters and energy resolution of p-type high purity Ge γ-detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1986-11

4. Hp Ge: Purification, Crystal Growth, and Annealing Properties;IEEE Transactions on Nuclear Science;1984

5. The electrical characterisation of semiconductors;Reports on Progress in Physics;1978-02-01

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