The Stress and Strength at the Neck of a Large Diameter Silicon Crystal during Growth
Author:
Affiliation:
1. Motorola, Incorporated, Sector Materials Operation, Phoenix, Arizona 85008
2. Motorola, Incorporated, Advanced Interconnect Systems Laboratories, Tempe, Arizona 85284
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Link
https://iopscience.iop.org/article/10.1149/1.1837911/pdf
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1. Constitutional Supercooling in Czochralski Growth οf Heavily Doped Silicon Crystals;Acta Physica Polonica A;2013-08
2. Silicon Processing;Materials Science and Technology;2013-02-15
3. Silicon Materials;Handbook of Semiconductor Manufacturing Technology, Second Edition;2007-07-09
4. Phosphorus Concentration Limitation in Czochralski Silicon Crystals;Journal of The Electrochemical Society;2000
5. Challenges for economical growth of high quality 300 mm CZ Si crystals;Microelectronic Engineering;1999-07
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