Carrier Concentration and Hall Mobility in Heavily Arsenic‐Diffused Silicon
Author:
Affiliation:
1. Department of Electrical Engineering, Keio University, Hiyoshi, Yokohama, 223, Japan
2. Nippon Telegraph and Telephone Public Corporation, Musashino Electrical Communication Laboratory, Musashino, Tokyo, 180, Japan
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Link
https://iopscience.iop.org/article/10.1149/1.2129969/pdf
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3. On the Basic Assumption to Obtain Carrier Concentration Profile by Differential Hall Coefficient Measurement;Japanese Journal of Applied Physics;1996-03-01
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