Confinement Phenomena in Buried Oxides of SIMOX Structures as Affected by Processing-Reference-Cited by-同舟云学术

Confinement Phenomena in Buried Oxides of SIMOX Structures as Affected by Processing

Published:1996-02-01 Issue:2 Volume:143 Page:695-700
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Afanas'ev V. V.¹²³,Revesz A. G.¹²³,Hughes H. L.¹²³

Affiliation:

1. Department of Applied Physics, University of Erlangen‐Nürnberg, Erlangen, Germany

2. Revesz Associates, Bethesda, Maryland 20817

3. Naval Research Laboratory, Washington, DC 20375

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.1836503/pdf

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