Characterization of (100)-Dominantly Oriented Poly-Si Thin Film Transistors Using Multi-Line Beam Continuous-Wave Laser Lateral Crystallization
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Published:2016-09-23
Issue:10
Volume:75
Page:49-54
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Transactions
Author:
Nguyen T. T.,Hiraiwa M.,Hirata T.,Kuroki S.-I.
Publisher
The Electrochemical Society