Beyond the Limit of Ideal Nernst Sensitivity: Ultra-High Sensitivity of Heavy Metal Ion Detection with Ion-Selective High Electron Mobility Transistors-Reference-Cited by-同舟云学术

Beyond the Limit of Ideal Nernst Sensitivity: Ultra-High Sensitivity of Heavy Metal Ion Detection with Ion-Selective High Electron Mobility Transistors

Published:2018 Issue:9 Volume:7 Page:Q176-Q183
ISSN:2162-8769
Container-title:ECS Journal of Solid State Science and Technology
language:en
Short-container-title:ECS J. Solid State Sci. Technol.

Author:

Chen Yi-Ting,Hseih Ching-Yen,Sarangadharan Indu,Sukesan Revathi,Lee Geng-Yen,Chyi Jen-Inn,Wang Yu-Lin^ORCID

Funder

Ministry of Science and Technology, Taiwan (MOST)

National Tsing Hua University (NTHU)

Publisher

The Electrochemical Society

Subject

Electronic, Optical and Magnetic Materials

Reference37 articles.

1. Heavy Metal Toxicity and the Environment

2. Toxicity, mechanism and health effects of some heavy metals

3. Heavy metal contamination and human health risk assessment in drinking water from shallow groundwater wells in an agricultural area in Ubon Ratchathani province, Thailand

4. Assessment of Heavy Metal Contamination in the Surrounding Soils and Surface Sediments in Xiawangang River, Qingshuitang District

5. Remediation of heavy metal contaminated ecosystem: an overview on technology advancement

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