Low‐Pressure Etching of Nanostructures and Via Holes Using an Inductively Coupled Plasma System

Author:

Berg E. W.1,Pang S. W.1

Affiliation:

1. Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109-2122, United States of America

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Cited by 25 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Heating mode transitions in capacitively coupled CF4 plasmas at low pressure;Plasma Sources Science and Technology;2024-08-01

2. Enhancing plasma uniformity by employing non-uniform magnetic field modulation in capacitively coupled plasmas;Applied Physics Letters;2023-11-13

3. Highly selective GaAs/AlGaAs dry etching using HBr/SF6/He;Journal of Vacuum Science & Technology B;2021-09

4. High verticality InP/InGaAsP etching in Cl2/H2/Ar inductively coupled plasma for photonic integrated circuits;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2011-01

5. Fabrication of submicron-sized features in InP/InGaAsP/AlGaInAs quantum well heterostructures by optimized inductively coupled plasma etching with Cl2/Ar/N2 chemistry;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-07

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