Rutherford Backscattering Spectroscopic Study of the Failure Mechanism of ( RuO2 + TiO2 ) / Ti Thin Film Electrodes in H 2 SO 4 Solutions-Reference-Cited by-同舟云学术

Rutherford Backscattering Spectroscopic Study of the Failure Mechanism of ( RuO2 + TiO2 ) / Ti Thin Film Electrodes in H 2 SO 4 Solutions

Published:1997-04-01 Issue:4 Volume:144 Page:1289-1295
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Vallet C. E.¹,Tilak B. V.²,Zuhr R. A.¹,Chen C.‐P.²

Affiliation:

1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831‐06197

2. Occidental Chemical Corporation, Grand Island, New York 14072

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.1837586/pdf

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