Characterization of Thin Film Molybdenum Silicide Oxide-Reference-Cited by-同舟云学术

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Characterization of Thin Film Molybdenum Silicide Oxide

Published:1980-05-01 Issue:5 Volume:127 Page:1128-1135
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Mochizuki T.¹,Kashiwagi M.¹

Affiliation:

1. NEC‐Toshiba Information Systems Incorporated, 72, Horikawa‐cho, Saiwai‐ku, Kawasaki, Japan 210

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2129832/pdf

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