Thickness Dependence of Transport Properties of Doped Polycrystalline Tin Oxide Films-Reference-Cited by-同舟云学术

Thickness Dependence of Transport Properties of Doped Polycrystalline Tin Oxide Films

Published:1985-06-01 Issue:6 Volume:132 Page:1398-1405
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Bélanger D.¹²³,Dodelet J. P.¹²³,Lombos B. A.¹²³,Dickson J. I.¹²³

Affiliation:

1. INRS‐Energie, Varennes, Québec, Canada J0L 2P0

2. Concordia University, Montreal, Québec, Canada H3G 1M8

3. Ecole Polytechnique, Montréal, Québec, Canada H3C 3A7

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2114132/pdf

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